Novel Fault Tolerant QCA Circuits

被引：0

作者：

Mahmoodi, Yasamin ^{[1
]}

Tehrani, Mohammad A. ^{[1
]}

机构：

[1] Elect & Comp Nanotechnol Lab Shahid Beheshti, Tehran 1983963113, Iran

来源：

2014 22ND IRANIAN CONFERENCE ON ELECTRICAL ENGINEERING (ICEE) | 2014年

关键词：

Quantum dot Cellular Automata; Defect; Fault tolerant; Full Adder; Serial Adder; QUANTUM CELLULAR-AUTOMATA; ARCHITECTURE; DESIGN; ARRAY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we present a fault tolerant full adder cell as well as a fault tolerant serial adder circuit. It is worthwhile that this is the first time that a real fault tolerant full adder cell has been proposed. This is the very same for the fault tolerant serial adder cell. We have also generated a program to assess the fault tolerance. While the other full adder designs seem to be sensitive to fault, it seems that the proposed cells are much more fault tolerant.

引用

页码：959 / 964

页数：6

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