Characterisation of Solid-phase-epitaxy of Amorphous Germanium Thin-films

被引：0
|
作者：
Leong, M. [1 ]
McCallum, J. C. [1 ]
Lee, K. K. [2 ]
Impellizzeri, G. [3 ,4 ]
Romano, L. [3 ,4 ]
机构：
[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
[2] Univ Melbourne, Ctr Quantum Comp Technol, Sch Phys, Melbourne, Vic 3010, Australia
[3] Univ Catania, CNR IMM MATIS, I-95123 Catania, Italy
[4] Univ Catania, Dept Phys & Astron, I-95123 Catania, Italy
来源：
2012 CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC MATERIALS AND DEVICES (COMMAD 2012) | 2012年
基金：
澳大利亚研究理事会;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The development of processes involving amorphous germanium for electronic and photonic applications is investigated.
引用
收藏
页码：177 / 177
页数：1
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