Elaboration and characterization of Cu/Co multilayered nanowires

被引:2
|
作者
Bran, Julien [1 ]
Jean, Malick
Larde, Rodrigue
Sauvage, Xavier
Le Breton, Jean-Marie
Pautrat, Alain [2 ]
机构
[1] Univ Rouen, Grp Phys Mat, UMR 6634, CNRS, F-76801 St Etienne Du Rouvray, France
[2] ENSICAEN, Lab Crismat, UMR 6508, CNRS, F-14050 Caen, France
关键词
Nanowire; Magnetoresistance; Electrodeposition; Atom probe tomography; ATOM-PROBE; MAGNETORESISTANCE;
D O I
10.3938/jkps.62.1744
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Multilayered Cu/Co nanowires were elaborated by a low cost electrochemical technique consisting in reducing alternatively the Cu2+ and Co2+ ions, through a porous commercial anodic aluminum oxide template, onto a conductive substrate. The deposition parameters were determined from current-potential curves. The structure of the nanowires was characterized down to the atomic scale by transmission electron microscopy and atom probe tomography. The results show that the multilayers are polycrystallized with a nanometric grain size. The Cu layers are almost pure, while the Co ones consist in a Co-rich alloy with about 12 to 15% Cu.
引用
收藏
页码:1744 / 1747
页数:4
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