Scattering Loss Estimation Using 2-D Fourier Analysis and Modeling of Sidewall Roughness on Optical Waveguides

被引：53

作者：

Jaberansary, E. ^{[1
]}

Masaud, T. M. B. ^{[1
]}

Milosevic, M. M. ^{[1
]}

Nedeljkovic, M. ^{[1
]}

Mashanovich, G. Z. ^{[1
]}

Chong, H. M. H. ^{[1
]}

机构：

[1] Univ Southampton, Nano Res Grp, Fac Phys & Appl Sci, Southampton SO17 1BJ, Hants, England

来源：

IEEE PHOTONICS JOURNAL | 2013年 / 5卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

Roughness; scattering loss; optical waveguide; STRIP;

D O I：

10.1109/JPHOT.2013.2251869

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report an accurate scattering loss 3-D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and finite-difference time domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3-D arbitrary shaped optical waveguides.

引用

页数：10

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