Characterization of dendrimers by X-ray photoelectron spectroscopy

被引：16
|
作者：
Demathieu, C
Chehimi, MM
Lipskier, JF
Caminade, AM
Majoral, JP
机构：
[1] Univ Paris 07, Inst Topol & Dynam Syst, CNRS, UPRESA 7086, F-75005 Paris, France
[2] Thomson CSF, Cent Rech Lab, F-91404 Orsay, France
[3] CNRS, Chim Coordinat Lab, F-31077 Toulouse, France
来源：
APPLIED SPECTROSCOPY | 1999年 / 53卷 / 10期
关键词：
dendrimers; thiophosphoryl group; phosphorus; sulfur; surface; XPS; chemical shifts;
D O I：
10.1366/0003702991945524
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A series of P=S-containing dendrimers (starburst macromolecules) were characterized hy X-ray photoelectron spectroscopy (XPS), This technique is a unique tool for the identification of specific groups from these starbursts such as P=S, aromatic rings, C-O, and C=O, Surface elemental and chemical composition is found to be generally in agreement with the expected stoichiometric formula.
引用
收藏
页码：1277 / 1281
页数：5
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