There has been significant progress in the past 2 decades in the field of organic and polymer thin-film transistors. In this paper, we report a combination of stable materials, device architecture, and process conditions that resulted in a patterned gate, small channel length (<5 mu m) device that possesses a scaled field-induced conductivity in air that is higher than any organic/polymer transistor reported thus far. The operating voltage is below 10 V; the on-off ratio is high; and the active materials are solution-processable. The semiconducting polymer is a new donor-acceptor polymer with furan-substituted diketopyrrolopyrrole and thienyl-vinylene-thienyl building blocks in the conjugated backbone. One of the major striking features of our work is that the patterned-gate device architecture is suitable for practical applications. We also propose a figure of merit to meaningfully compare polymer/organic transistor performance that takes into account mobility and operating voltage. With this figure of merit, we compare leading organic and polymer transistors that have been hitherto reported. The material and device architecture have shown very high mobility and low operating voltage for such short channel length (below 5 mu m) organic/polymer transistors.
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Elect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Baeg, Kang-Jun
Khim, Dongyoon
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Gwangju Inst Sci & Technol, Heeger Ctr Adv Mat, Sch Mat Sci & Engn, Kwangju 500712, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Khim, Dongyoon
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Kim, Juhwan
Kim, Dong-Yu
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Gwangju Inst Sci & Technol, Heeger Ctr Adv Mat, Sch Mat Sci & Engn, Kwangju 500712, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Kim, Dong-Yu
Sung, Si-Woo
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Chungbuk Natl Univ, Sch Elect & Comp Engn, Chonju 361763, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
机构:
Elect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Baeg, Kang-Jun
Khim, Dongyoon
论文数: 0引用数: 0
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机构:
Gwangju Inst Sci & Technol, Heeger Ctr Adv Mat, Sch Mat Sci & Engn, Kwangju 500712, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Khim, Dongyoon
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机构:
Kim, Juhwan
Kim, Dong-Yu
论文数: 0引用数: 0
h-index: 0
机构:
Gwangju Inst Sci & Technol, Heeger Ctr Adv Mat, Sch Mat Sci & Engn, Kwangju 500712, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea
Kim, Dong-Yu
Sung, Si-Woo
论文数: 0引用数: 0
h-index: 0
机构:
Chungbuk Natl Univ, Sch Elect & Comp Engn, Chonju 361763, South KoreaElect & Telecommun Res Inst, Convergence Components & Mat Res Lab, Taejon 305700, South Korea