共 18 条
- [1] Characterization of SiCl4/N2 plasmas [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (03) : G210 - G212
- [2] [Anonymous], INTERACTIONS PHOTO C
- [3] Computation of electron-impact total and differential cross sections for allene (C3H4) in the energy range 0.1-2000 eV [J]. PHYSICAL REVIEW A, 2013, 87 (06):
- [6] Low bias reactive ion etching of GaAs with a SiCl4/N2/O2 time-multiplexed process [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2007, 25 (03): : 839 - 844
- [8] TOTAL (ELASTIC PLUS INELASTIC) CROSS-SECTIONS FOR ELECTRON-SCATTERING FROM DIATOMIC AND POLYATOMIC-MOLECULES AT 10-EV-5000-EV - H2, LI2, HF, CH4, N2, CO, C2H2, HCN, O2, HCL, H2S, PH3, SIH4, AND CO2 [J]. PHYSICAL REVIEW A, 1992, 45 (01): : 202 - 218
- [10] Lide D.R., 2004, CRC Handbook of Chemistry and Physics, Internet Version 2005, V85