Analysis of white-light interferograms by using Stockwell transform

被引：7
作者：
Sarac, Zehra [1 ]
机构：
[1] Zonguldak Karaelmas Univ, Dept Elect & Elect Engn, TR-67100 Incivez Mah, Zonguldak, Turkey
来源：
OPTICS AND LASERS IN ENGINEERING | 2008年 / 46卷 / 11期
关键词：
Stockwell transform; white-light interferogram; standard deviation; sampling; intensity and dispersion noise;
D O I：
10.1016/j.optlaseng.2008.05.017
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper proposes the use of Stockwell transform for the analysis of white-light interferograms. The performance of Stockwell transform is assessed from the statistical parameters obtained by analyzing the simulated and experimental interferograms. Furthermore, the sensitivity of Stockwell transform to intensity and the phase noises is investigated. Results show that sampling and intensity noises significantly affect the performance of Stockwell transform. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码：823 / 828
页数：6
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