Magnetic force microscopy study of perpendicular media: Signal-to-noise determination and transition noise analysis

被引：14

作者：

Svedberg, EB ^{[1
]}

Khizroev, S ^{[1
]}

Litvinov, D ^{[1
]}

机构：

[1] Seagate Technol, Pittsburgh, PA 15203 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2002年 / 91卷 / 08期

关键词：

D O I：

10.1063/1.1459602

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Signal-to-noise ratio (SNR) from a limited bit sequence has been extracted from magnetic force microscopy (MFM) images by two different methods and compared. The autocorrelation SNR properties extracted from the MFM image data are in better agreement with spinstand data than "normal" Fourier extracted SNR values. Transition noise data were also extracted and analyzed, "Squeezing" of the noise was measured as the periodicity of the recorded bit pattern became smaller than 250 nm and subsequently a relaxation at similar to200 nm occurred. MFM analysis based SNR data for two media types (CoCrPtTa alloy and CoB/Pd multilayer based) are compared. Ni45Fe55 alloy was used for the soft underlayer material. (C) 2002 American Institute of Physics.

引用

页码：5365 / 5370

页数：6

共 18 条

[1]

Bendat J.S., 1971, RANDOM DATA ANAL MEA

[2] Analysis of two-dimensional medium noise and magnetic cluster with MFM for Co82Cr13Ta5 longitudinal magnetic recording media [J].