An approach for evaluation of redundancy analysis algorithms

被引：29

作者：

Shoukourian, S ^{[1
]}

Vardanian, V ^{[1
]}

Zorian, Y ^{[1
]}

机构：

[1] Virage Log Inc, Yerevan 375033, Armenia

来源：

2001 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/MTDT.2001.945228

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

An approach for design and evaluation of redundancy analysis algorithms based on vectors of preferences is proposed for memory devices with spare elements. Experiments on the application of the new algorithms for Self-Test and Repair (STAR) type SRAM memories have shown the efficiency of the proposed approach.

引用

页码：51 / 55

页数：5

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