Domain Wall Roughness in Stripe Phase BiFeO3 Thin Films

被引：31

作者：

Ziegler, B. ^{[1
]}

Martens, K. ^{[1
,2
,3
]}

Giamarchi, T. ^{[1
]}

Paruch, P. ^{[1
]}

机构：

[1] Univ Geneva, DPMC MaNEP, CH-1211 Geneva, Switzerland

[2] Univ Grenoble 1, LIPhy, UMR 5588, F-38402 St Martin Dheres, France

[3] CNRS, F-38402 St Martin Dheres, France

来源：

PHYSICAL REVIEW LETTERS | 2013年 / 111卷 / 24期

基金：

瑞士国家科学基金会;

关键词：

DISORDERED ELASTIC-SYSTEMS; NANOSCALE CONTROL; MULTIFERROICS;

D O I：

10.1103/PhysRevLett.111.247604

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Using the model system of ferroelectric domain walls, we explore the effects of long-range dipolar interactions and periodic ordering on the behavior of pinned elastic interfaces. In piezoresponse force microscopy studies of the characteristic roughening of intrinsic 71 degrees stripe domains in BiFeO3 thin films, we find unexpectedly high values of the roughness exponent sigma = 0: 74 +/- 0.10, significantly different from those obtained for artificially written domain walls in this and other ferroelectric materials. The large value of the exponent suggests that a random field-dominated pinning, combined with stronger disorder and strain effects due to the step-bunching morphology of the samples, could be the dominant source of pinning in the system.

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页数：5

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