共 20 条
[1]
Agilent Technologies, 2007, AG 5400 SCANN PROB M
[2]
[Anonymous], 2008, D652108 ASTM
[3]
[Anonymous], 2004, ASTM D2872-04
[5]
MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1989, 7 (04)
:2906-2913
[7]
Howland R., 2000, PRACTICAL GUIDE SCAN, V1st
[8]
Jäger A, 2007, INT J MATER RES, V98, P404
[9]
Jager A., 2004, PAMM, V4, P400
[10]
Jones D.R., 1993, SHRP A 645 SHRP MAT