Spin-dependent synchrotron x-ray excitations studied by scanning tunneling microscopy

被引：12

作者：

Rose, V. ^{[1
]}

Chien, T. Y. ^{[1
]}

Freeland, J. W. ^{[1
]}

Rosenmann, D. ^{[2
]}

Hiller, J. ^{[3
]}

Metlushko, V. ^{[4
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL 60439 USA

[4] Univ Illinois, Chicago, IL 60612 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2012年 / 111卷 / 07期

关键词：

RADIATION; TIP; PROBE;

D O I：

10.1063/1.3670968

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The ability to position a sharp probe in close proximity to a sample while the surface is illuminated by synchrotron x-rays opens a path to localized spectroscopy and imaging with chemical and magnetic contrast. We have employed a scanning tunneling microscope for the local study of synchrotron x-ray magnetic circular dichroism of micron-sized NiFe rings. Spectra have been obtained by an insulator-coated tip positioned about 200 nm over the sample surface. A negative sample bias is required in order to enhance the dichroism signal at the tip. (C) 2012 American Institute of Physics. [doi:10.1063/1.3670968]

引用

页数：3

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