共 6 条
- [1] Physical oxide thickness extraction and verification using quantum mechanical simulation [J]. INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST, 1997, : 869 - 872
- [4] Accurate doping profile determination using TED/QM models extensible to sub-quarter micron nMOSFETs [J]. IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, : 811 - 814
- [6] YU Z, COMMUNICATION