Integration Trends in Monolithic Power ICs: Application and Technology Challenges

被引:16
作者
Rose, Matthias [1 ]
Bergveld, Henk Jan [1 ]
机构
[1] NXP Semicond, Technol & Operat, AMS IP, Power Management, NL-5656 AE Eindhoven, Netherlands
关键词
BCD technology; CMOS technology; DC/DC converter; ESD protection; high-voltage devices; integrated passives; interfaces; monolithic integration; power management; SILICON-CONTROLLED RECTIFIER; DC-DC CONVERTER; SWITCHED-CAPACITOR; VOLTAGE REGULATOR; BCD TECHNOLOGY; MIM CAPACITOR; 6; V; SOI; DESIGN; 0.35-MU-M;
D O I
10.1109/JSSC.2016.2566612
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper highlights the general trend towards further monolithic integration in power applications by enabling power management and interfacing solutions in advanced CMOS nodes. The need to combine high-density digital circuits, power-management circuits, and robust interfaces in a single technology platform requires the development of additional process options on top of baseline CMOS. Examples include high-voltage devices, devices to enable area-efficient ESD protection, and integrated capacitors and inductors with high quality factors. The use of bipolar devices in these technologies for protection and control purposes in power applications is also addressed.
引用
收藏
页码:1965 / 1974
页数:10
相关论文
共 61 条
[21]  
Gendron A., 2011, EOS ESD S, P1
[22]  
Heringa A, 2008, INT SYM POW SEMICOND, P271
[23]   A 100 MHz 82.4% Efficiency Package-Bondwire Based Four-Phase Fully-Integrated Buck Converter With Flying Capacitor for Area Reduction [J].
Huang, Cheng ;
Mok, Philip K. T. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (12) :2977-2988
[24]  
Huang TY, 2014, PROC INT SYMP POWER, P179
[25]  
Il-Yong Park, 2011, 8th International Conference on Power Electronics - ECCE Asia, P318
[26]  
Iwamoto K, 2014, PROC INT SYMP POWER, P402, DOI 10.1109/ISPSD.2014.6856061
[27]   A 0.45-1 V Fully-Integrated Distributed Switched Capacitor DC-DC Converter With High Density MIM Capacitor in 22 nm Tri-Gate CMOS [J].
Jain, Rinkle ;
Geuskens, Bibiche M. ;
Kim, Stephen T. ;
Khellah, Muhammad M. ;
Kulkarni, Jaydeep ;
Tschanz, James W. ;
De, Vivek .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2014, 49 (04) :917-927
[28]  
Karadi R, 2015, IEEE W CONTR MODEL
[29]  
Karadi R, 2014, ISSCC DIG TECH PAP I, V57, P92, DOI 10.1109/ISSCC.2014.6757352
[30]   Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits [J].
Ker, MD ;
Hsu, KC .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2005, 5 (02) :235-249