I-DDQ testing: Issues present and future

被引：33
作者：
Soden, JM [1 ]
Hawkins, CF [1 ]
机构：
[1] UNIV NEW MEXICO, ALBUQUERQUE, NM 87131 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 04期
关键词：
D O I：
10.1109/54.544537
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
I-DDQ testing has progressed to become a mainstream test method, but two issues confront this highly efficient test practice. One issue is the cost impact of product loss due to increased defect detection. The other is the increased background current associated with the new deep-submicron technologies.
引用
收藏
页码：61 / 65
页数：5
相关论文
共 21 条
  • [11] Maxwell P. C., 1992, Journal of Electronic Testing: Theory and Applications, V3, P305, DOI 10.1007/BF00135334
  • [12] Mills TB, 1995, PROCEEDINGS OF THE 1995 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, P66, DOI 10.1109/BIPOL.1995.493868
  • [13] High resolution I-DDQ characterization and testing - Practical issues
    Righter, AW
    Soden, JM
    Beegle, RW
    [J]. INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 259 - 268
  • [14] Separate I-DDQ testing of signal and bias paths in CMOS ICs for defect diagnosis
    Sachdev, M
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 8 (02): : 203 - 214
  • [15] SEGURA JA, 1992, J ELECT TESTING THEO, V3
  • [16] *SEM IND ASS, 1994, NAT TECHN ROADM SEM
  • [17] Soden J. M., 1992, Journal of Electronic Testing: Theory and Applications, V3, P291, DOI 10.1007/BF00135333
  • [18] SODEN JM, 1966, IEEE SPECTRUM SEP, P66
  • [19] Storey T., 1991, Proceedings. International Test Conference 1991 (IEEE Cat. No.91CH3032-0), P311, DOI 10.1109/TEST.1991.519523
  • [20] Wallquist KM, 1995, PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995, P910, DOI 10.1109/TEST.1995.529924
123