Investigation of the low- and infralow-frequency dielectric response of Ba0.7Sr0.3TiO3 thin films

被引：0

作者：

Laletin, R. A.

Burkhanov, A. I.

Shil'nikov, A. V.

Sigov, A. S.

Vorotilov, K. A.

Vasil'ev, V. A.

机构：

[1] Volgograd State Architecture & Bldg Univ, Volgograd 400074, Russia

[2] Tech Univ, Moscow State Inst Radio Engn Elect & Automat, Moscow 119454, Russia

来源：

PHYSICS OF THE SOLID STATE | 2006年 / 48卷 / 06期

关键词：

77.22.-d; 77.84.Dy; 77.22.Gm;

D O I：

10.1134/S1063783406060503

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The low- and infralow-frequency dielectric properties of Ba0.7Sr0.3TiO3 thin films annealed at temperatures of 750 and 900 degrees C are investigated over wide ranges of temperatures (from -180 to +100 degrees C), frequencies (from 0.1 Hz to 10.0 kHz), and amplitudes of the measuring electric field (from 15 to 255 kV/cm). The samples are found to undergo giant relaxation characteristic of layered heterogeneous structures. It is noted that, at a higher annealing temperature (900 degrees C), the relaxation region is shifted toward lower temperatures (higher frequencies).

引用

页码：1177 / 1178

页数：2

共 4 条

[1] The effect of annealing on the structure and dielectric properties of BaxSr1-xTiO3 ferroelectric thin films [J].