Traceability and Risk Analysis Strategies for Addressing Counterfeit Electronics in Supply Chains for Complex Systems

被引:40
作者
DiMase, Daniel [1 ]
Collier, Zachary A. [2 ]
Carlson, Jinae [1 ]
Gray, Robin B., Jr. [3 ]
Linkov, Igor [2 ]
机构
[1] Honeywell, Phoenix, AZ USA
[2] US Army Engineer Res & Dev Ctr, Concord, MA 01742 USA
[3] ECIA, Alpharetta, GA USA
关键词
Counterfeit; semiconductors; supply chain risk management; traceability; INTEGRATED-CIRCUITS; MANAGEMENT;
D O I
10.1111/risa.12536
中图分类号
R1 [预防医学、卫生学];
学科分类号
1004 ; 120402 ;
摘要
Within the microelectronics industry, there is a growing concern regarding the introduction of counterfeit electronic parts into the supply chain. Even though this problem is widespread, there have been limited attempts to implement risk-based approaches for testing and supply chain management. Supply chain risk management tends to focus on the highly visible disruptions of the supply chain instead of the covert entrance of counterfeits; thus counterfeit risk is difficult to mitigate. This article provides an overview of the complexities of the electronics supply chain, and highlights some gaps in risk assessment practices. In particular, this article calls for enhanced traceability capabilities to track and trace parts at risk through various stages of the supply chain. Placing the focus on risk-informed decision making through the following strategies is needed, including prioritization of high-risk parts, moving beyond certificates of conformance, incentivizing best supply chain management practices, adoption of industry standards, and design and management for supply chain resilience.
引用
收藏
页码:1834 / 1843
页数:10
相关论文
共 46 条
  • [11] [Anonymous], 2012, GAO12375
  • [12] [Anonymous], SEMI INT STAND
  • [13] [Anonymous], SUPPLY CHAIN RISK
  • [14] [Anonymous], ENV SYSTEMS DECISION
  • [15] [Anonymous], NAT STRAT GLOB SUPPL
  • [16] [Anonymous], IMPROVING CRITICAL I
  • [17] [Anonymous], 2009, RES REP CONS ATT PER
  • [18] [Anonymous], P 37 INT S TEST FAIL
  • [19] [Anonymous], 2011, INTRO HARDWARE SECUR
  • [20] Supply chain design and analysis: Models and methods
    Beamon, BM
    [J]. INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, 1998, 55 (03) : 281 - 294