Electrochromism in WOx and WxSiyOz Thin Films Prepared by Magnetron Sputtering at Glancing Angles

被引:18
作者
Garcia-Garcia, F. J. [1 ]
Gil-Rostra, J. [1 ]
Yubero, F. [1 ]
Gonzalez-Elipe, A. R. [1 ]
机构
[1] Univ Seville, CSIC, Inst Cienca Mat Sevilla, Seville 41092, Spain
关键词
Electrochromic Thin Films; GLAD; Reactive Magnetron Sputtering; Electrical Properties; Optical Properties; NANOSTRUCTURED TUNGSTEN; DEPOSITION;
D O I
10.1166/nnl.2013.1449
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This work reports the electrochromic evaluation of WxSiyOz and WOx glad thin films deposited by reactive magnetron sputtering at glancing angle. Their electrochemical properties were assessed by the analysis of cyclic voltamnnetry and chronoamperometry measurements in 0.1 M HClO4, whereas their optical properties were determined by studying their transmission and absorption spectra under operation conditions. Both types of thin films presented outstanding electrochromic properties characterized by a fast response, a high coloration and a complete reversibility after more than one thousand cycles.
引用
收藏
页码:89 / 93
页数:5
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