X-ray photoelectron spectroscopy of zinc phosphide thin film

被引：15

作者：

Nayak, A

Banerjee, HD ^{[1
]}

机构：

[1] Indian Inst Technol, Ctr Mat Sci, Kharagpur 721302, W Bengal, India

[2] Darjeeling Govt Coll, Dept Phys, Darjeeling 734101, India

来源：

APPLIED SURFACE SCIENCE | 1999年 / 148卷 / 3-4期

关键词：

chemical shift; bond ionicity; auger parameter; chemical composition; relaxation energy;

D O I：

10.1016/S0169-4332(99)00144-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy (XPS) has been used: to study core level spectra of electron beam evaporated zinc phosphide (Zn3P2) thin films. The chemical shifts of XPS core lines (Zn 2P(3/2) and P 2p) and Auger parameter for zinc (beta(Zn) = 2013.9 eV) have been calculated. The results have been used to determine the bond ionicity (similar to 20%) and composition (Zn0.55P0.45) of the zinc phosphide films. An approximate value for the surface Madelung Constant (alpha(S) = 1.51-1.57) has been obtained for tetragonal zinc phosphide structure. The effect of relaxation on the chemical shift has been found to be relatively small. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：205 / 210

页数：6

共 23 条

[1] DETERMINATION OF IONICITY IN ZINC PHOSPHIDE AND ZINC ARSENIDE BY X-RAY ABSORPTION METHOD [J].