Low-frequency Vibrational Dynamics of Amorphous and Crystalline Silica

被引：5

作者：

Albers, Peter W. ^{[1
]}

Michael, Guenther ^{[2
]}

Rotgerink, Hans Lansink ^{[2
]}

Reisinger, Martin ^{[2
]}

Parker, Stewart F. ^{[3
]}

机构：

[1] AQura GmbH, D-63457 Hanau, Germany

[2] Evonik Ind AG, Business Unit Inorgan Mat, D-63457 Hanau, Germany

[3] STFC Rutherford Appleton Lab, ISIS Facil, Didcot OX11 0QX, Oxon, England

来源：

ZEITSCHRIFT FUR NATURFORSCHUNG SECTION B-A JOURNAL OF CHEMICAL SCIENCES | 2012年 / 67卷 / 10期

关键词：

Silica; Amorphous; Crystalline; Vibrational Density of States; MODES; SURFACE;

D O I：

10.5560/ZNB.2012-0110

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

Crystalline silica shows strong, sharp signals at about 77 and 130 cm(-1) in the inelastic neutron scattering spectrum that are missing or strongly different, broadened and shifted to lower frequency for the case of precipitated and fumed silica. The presence or absence of these signals is a sensitive signature of crystallinity or amorphicity in silica. The low-frequency phonon density of states of precipitated and fumed silica is typical for completely amorphous materials. This observation is in perfect agreement with data from X-ray diffraction and high-resolution transmission electron microscopy. The amorphicity is retained during granulation post-treatments.

引用

页码：1016 / 1020

页数：5