A New High-Resolution, High-Throughput Spectrometer: First Experience as Applied to Raman Spectroscopy

被引：12

作者：

Meade, Jeffrey T. ^{[1
]}

Behr, Bradford B. ^{[2
]}

Hajian, Arsen R. ^{[3
]}

机构：

[1] Arjae Spectral, 555 Richmond St W,Suite 708, Toronto, ON M5V 3B1, Canada

[2] Arjae Spectral, Ithaca, NY 14850 USA

[3] Tornado Med Syst, Toronto, ON M5V 3B1, Canada

来源：

NEXT-GENERATION SPECTROSCOPIC TECHNOLOGIES V | 2012年 / 8374卷

关键词：

virtual slit; Raman; etendue; high throughput; high resolution; slicer; hyperspectral; IMAGE-SLICER;

D O I：

10.1117/12.919062

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The classic trade-off between resolution and throughput in a dispersive spectrometer is overcome using virtual slit technology. An optimized spectrometer designed from the ground up to incorporate a virtual slit is experimentally demonstrated by Raman experiments.

引用

页数：8

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