Filter-based interrogation unit for optical wavelength shift sensors

被引：1

作者：

Wuchrer, Roland ^{[1
]}

Haertling, Thomas ^{[1
]}

机构：

[1] Fraunhofer Inst Nondestruct Testing, Dresden Branch, D-01109 Dresden, Germany

来源：

SMART SENSOR PHENOMENA, TECHNOLOGY, NETWORKS, AND SYSTEMS INTEGRATION 2013 | 2013年 / 8693卷

关键词：

filter-based spectrometer; linear variable filter; position detector; fiber Bragg grating sensors;

D O I：

10.1117/12.2009093

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a filter-based spectrometer consisting of a dielectric thin film filter with a lateral-spectral transmission gradient (linear variable filter) and a position detector which allows high resolution in wavelength shift registration. The resolving capacity of two interrogation unit variants (with segmented and homogeneous position detector, respectively) is examined using a monochromatic tunable light source. On the basis of the obtained results, we discuss several advantages and drawbacks of this interrogation approach.

引用

页数：5

共 7 条

[1] Design and implementation of a sub-nm resolution microspectrometer based on a Linear-Variable Optical Filter [J].