Influence of La addition on the semi-conductive properties of passive films formed on Cu-Ni alloy

被引:8
|
作者
Leng, Xiang [1 ]
Zhang, Yadong [1 ]
Zhou, Qiongyu [1 ]
Zhang, Yinghui [1 ]
Wang, Zhigang [1 ]
Wang, Hang [1 ,2 ]
Yang, Bin [1 ,2 ]
机构
[1] Jiangxi Univ Sci & Technol, Sch Mat Sci & Engn, Ganzhou 341000, Peoples R China
[2] Jiangxi Univ Sci & Technol, Inst Engn Res, Ganzhou 341000, Peoples R China
来源
MATERIALS RESEARCH EXPRESS | 2018年 / 5卷 / 05期
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
Cu-Ni alloy; rare earth; passive film; mott-schottky analysis; point defect model; COPPER-NICKEL-ALLOYS; CORROSION BEHAVIOR; SEMICONDUCTING PROPERTIES; RESISTANCE; MICROSTRUCTURE; SURFACE; OXIDE;
D O I
10.1088/2053-1591/aac277
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The semi-conductive properties of passive films formed on Cu-Ni alloy and Cu-Ni-La alloy were investigated in 0.1 M NaOH solution, by employing electrochemical impedance spectroscopy (EIS), Mott-Schottky analysis and point defect model (PDM). Results indicate that both the passive films formed on Cu-Ni alloy and Cu-Ni-La alloy display p-type semi-conductive characteristics with cation vacancies in order of magnitude of 10(20) cm(3). Compared with Cu-Ni alloy, La addition could significantly improve the corrosion resistance, due to a superior barrier passive film formed Cu-Ni-La alloy with a bigger film resistance (R-f), increased passive film thickness (L-ss) in conjunction with decreased diffusion coefficient (D-0).
引用
收藏
页数:11
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