Depth dependent structure and magnetic properties and their correlation with magnetotransport in Fe/Au multilayers

被引：6
作者：
Singh, Surendra [1 ]
Basu, Saibal [1 ]
Prajapat, C. L. [2 ]
Gupta, M. [3 ]
Poswal, A. K. [4 ]
Bhattacharya, D. [1 ]
机构：
[1] Bhabha Atom Res Ctr, Div Solid State Phys, Bombay 400085, Maharashtra, India
[2] Bhabha Atom Res Ctr, Tech Phys Div, Bombay 400085, Maharashtra, India
[3] UGC DAE CSR, Indore 452017, Madhya Pradesh, India
[4] Bhabha Atom Res Ctr, Appl Spect Div, Bombay 400085, Maharashtra, India
来源：
THIN SOLID FILMS | 2014年 / 550卷
关键词：
Interface magnetism; Neutron and X-ray reflectivity; Magnetoresistance; Interface morphology; GIANT MAGNETORESISTANCE; X-RAY; INTERFACIAL ROUGHNESS; ELECTRONIC-PROPERTIES; BAND-STRUCTURE; SUPERLATTICES; REFLECTION; ANISOTROPY; TRANSITION; SCATTERING;
D O I：
10.1016/j.tsf.2013.10.025
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A detailed study on the role of interface structure and magnetism in magnetoresistance (MR) in Fe/Au multilayers has been carried out. Two series of multilayers were deposited on Si substrate by sputtering: one series with varying Fe layer thickness, t(Fe) = 30-100 angstrom, and another series with varying Au layer thickness t(Au) = 50-150 angstrom. MR measurements were done using a 4-probe technique. The multilayer interface structure and magnetic properties were studied by specular X-ray reflectometry and polarized neutron reflectometry (PNR). Details of the interface fractal morphology were obtained from diffuse X-ray reflectivity (DXRR). Bulk magnetic measurements were carried out on a superconducting quantum interference device magnetometer. Change in MR can be associated with magnetic and morphological properties of Fe/Au and Au/Fe interfaces in Fe/Au multilayer samples as obtained by reflectometry. Large MR is also associated to interfaces with larger magnetization, large in-plane correlation length and higher Hurst parameter, obtained from PNR and DXRR. (C) 2013 Elsevier B. V. All rights reserved.
引用
收藏
页码：326 / 333
页数：8
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