Scattering by FSS on anisotropic substrate for TE and TM excitation

被引：28

作者：

Campos, ALPS ^{[1
]}

d'Assunçao, AG

de Mendonça, LM

机构：

[1] Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil

[2] Univ Fed Rio Grande Norte, Dept Elect Engn, BR-59072970 Natal, RN, Brazil

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2002年 / 50卷 / 01期

关键词：

anisotropic substrate; dielectric anisotropy; frequency-selective surfaces; FSS;

D O I：

10.1109/22.981249

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The scattering of electromagnetic waves from frequency-selective surfaces (FSS) composed of rectangular conducting patches mounted on uniaxial dielectric anisotropic substrate is investigated by using a full-wave analysis. The moment method is used in combination with the spectral-domain immitance approach to determine reflection and transmission coefficients of the FSS structure as function of the geometry parameters and dielectric anisotropy. The analysis provides very accurate results compared to those presented by others and to those obtained by measurements.

引用

页码：72 / 76

页数：5

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