Measurement Accuracy of Fringe Projection Depending on Surface Normal Direction

被引:6
作者
Kuehmstedt, Peter [1 ]
Braeuer-Burchardt, Christian [1 ]
Notni, Gunther [1 ]
机构
[1] Fraunhofer IOF Jena, D-07745 Jena, Germany
来源
OPTICAL INSPECTION AND METROLOGY FOR NON-OPTICS INDUSTRIES | 2009年 / 7432卷
关键词
measurement accuracy; fringe projection; error analysis; position and surface normal depending accuracy; 3-DIMENSIONAL MEASUREMENT;
D O I
10.1117/12.827057
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An accuracy analysis of fringe projection systems is performed taking into account the geometric properties of the sensor and the surface shape of the measuring objects. Especially the deviations of the normal vector directions between the optical axis of projection and observation contribute to differences in the achievable measuring accuracy. An accuracy model was developed which describes the relation between the (fix) geometry of the sensor components and the (variable) conditions of the measurement characterized by a set of parameters on the one side and the measuring accuracy on the other side.
引用
收藏
页数:9
相关论文
共 15 条
[1]  
[Anonymous], 2006, 26343 VDIVDE
[2]  
Ehrig W., 2007, OPT MEAS SYST P SPIE
[3]  
Hintersehr J., 2009, QUINTESSENZ ZAHNTECH, V35, P446
[4]   Adaptive optical three-dimensional measurement with structured light [J].
Kowarschik, R ;
Kuhmstedt, P ;
Gerber, J ;
Schreiber, W ;
Notni, G .
OPTICAL ENGINEERING, 2000, 39 (01) :150-158
[5]  
Kuehmstedt P., 2001, P FRING 01, V1, P667
[6]   Optical 3D sensor for large objects in industrial application [J].
Kühmstedt, P ;
Heinze, M ;
Himmelreich, M ;
Bräuer-Burchardt, C ;
Brakhage, P ;
Notni, G .
Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 :118-127
[7]   Phasogrammetric optical 3D-sensor for the measurement of large objects [J].
Kühmstedt, P ;
Heinze, M ;
Himmelreich, M ;
Notni, G ;
Bräuer-Burchardt, C ;
Notni, G .
OPTICAL METROLOGY IN PRODUCTION ENGINEERING, 2004, 5457 :56-64
[8]  
Kuhmstedt P., 2007, P SPIE, P6616
[9]  
Kuhmstedt P., 2007, P SPIE, V6762
[10]  
Luhmann Thomas., 2006, Close range photogrammetry: principles, techniques and applications