Wiener-Hopf Analysis of the Diffraction by a Thin Material Strip

被引：0

作者：

Nagasaka, Takashi ^{[1
]}

Kobayashi, Kazuya ^{[1
]}

机构：

[1] Chuo Univ, Dept Elect Elect & Commun Engn, Tokyo 1128551, Japan

来源：

2016 URSI INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC THEORY (EMTS) | 2016年

关键词：

HIGH-FREQUENCY SCATTERING;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The plane wave diffraction by a thin material strip is analyzed using the Wiener-Hopf technique and approximate boundary conditions. An asymptotic solution is obtained under the condition that the strip width is large compared with the wavelength. Applying the saddle point method, the scattered far field is evaluated asymptotically. Numerical results on the radar cross section (RCS) are presented.

引用

页码：557 / 560

页数：4

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