Room-temperature chlorination of As-rich GaAs (110)

被引:10
作者
Simpson, WC
Shuh, DK
Yarmoff, JA
机构
[1] UNIV CALIF RIVERSIDE,DEPT PHYS,RIVERSIDE,CA 92521
[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720
[3] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV CHEM SCI,BERKELEY,CA 94720
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 04期
关键词
D O I
10.1116/1.588933
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As-rich GaAs (110) is prepared by ion bombardment and annealing, followed by chlorination and reannealing. The surface is then reacted at room temperature with Cl-2 gas and examined with soft x-ray photoelectron spectroscopy of the Ga and As 3d core levels. After low exposures (<5x10(4) L), the surface appears to passivate with half a monolayer of C1 adsorbed, primarily as AsCl. Following sufficiently large (>5x10(4) L) exposures, however, the surface begins to etch, as indicated by the continuous uptake of chlorine and the formation of As and Ga chlorides. After the largest exposures, the distribution of As chlorides still favors the monochloride, whereas the Ga chlorides favor GaCl2. It is proposed that the heavily reacted surface is covered with -AsCl-GaCl2 treelike structures. The addition of C1 to form GaCl3 from GaCl2 is identified as the rate-limiting step in the overall etching reaction. (C) 1996 American Vacuum Society.
引用
收藏
页码:2909 / 2913
页数:5
相关论文
共 22 条
  • [1] CHIANG TT, 1988, J VAC SCI TECHNOL A, V7, P724
  • [2] ANGLE-RESOLVED SUPERSONIC MOLECULAR-BEAM STUDY OF THE CL2/GAAS(110) THERMAL ETCHING REACTION
    DELOUISE, LA
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1991, 94 (02) : 1528 - 1542
  • [3] OBSERVATION OF COMPETING ARSENIC REMOVAL CHANNELS IN THE CL2+GAAS REACTION
    HOU, HQ
    ZHANG, ZJ
    CHEN, SH
    SU, CC
    YAN, WR
    VERNON, M
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (08) : 801 - 803
  • [4] IODINE ETCHING OF GAAS(1BAR1BAR1BAR)ARSENIC SURFACE STUDIED BY LEED, AES, AND MASS-SPECTROSCOPY
    JACOBI, K
    STEINERT, G
    RANKE, W
    [J]. SURFACE SCIENCE, 1976, 57 (02) : 571 - 579
  • [5] JONES RG, 1989, SURF SCI, V208, pL34, DOI 10.1016/0039-6028(89)90027-7
  • [6] XEF2 ETCHING OF SI(111) - THE GEOMETRIC STRUCTURE OF THE REACTION LAYER
    LO, CW
    SHUH, DK
    CHAKARIAN, V
    DURBIN, TD
    VAREKAMP, PR
    YARMOFF, JA
    [J]. PHYSICAL REVIEW B, 1993, 47 (23): : 15648 - 15659
  • [7] ATOMIC LAYER ETCHING CHEMISTRY OF CL2 ON GAAS(100)
    LUDVIKSSON, A
    XU, MD
    MARTIN, RM
    [J]. SURFACE SCIENCE, 1992, 277 (03) : 282 - 300
  • [8] THE ADSORPTION AND DESORPTION OF IODINE ON INSB(001)
    MOWBRAY, AP
    JONES, RG
    [J]. VACUUM, 1990, 41 (1-3) : 672 - 675
  • [9] STRUCTURE OF THE GAAS(110) SURFACE IN AS-RICH CONDITIONS
    NORTHRUP, JE
    [J]. PHYSICAL REVIEW B, 1991, 44 (03) : 1349 - 1352
  • [10] ADSORPTION OF CHLORINE ON GAAS(110) INVESTIGATED BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
    PANKRATZ, J
    NIENHAUS, H
    MONCH, W
    [J]. SURFACE SCIENCE, 1994, 307 : 211 - 215