Note: A resonating reflector-based optical system for motion measurement in micro-cantilever arrays

被引:4
作者
Sathishkumar, P. [1 ]
Punyabrahma, P. [1 ]
Mrinalini, R. Sri Muthu [1 ]
Jayanth, G. R. [1 ]
机构
[1] Indian Inst Sci, Dept Instrumentat & Appl Phys, Bangalore 560012, Karnataka, India
关键词
ATOMIC-FORCE MICROSCOPY; BIOSENSORS;
D O I
10.1063/1.4930877
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A robust, compact optical measurement unit for motion measurement in micro-cantilever arrays enables development of portable micro-cantilever sensors. This paper reports on an optical beam deflection-based system to measure the deflection of micro-cantilevers in an array that employs a single laser source, a single detector, and a resonating reflector to scan the measurement laser across the array. A strategy is also proposed to extract the deflection of individual cantilevers from the acquired data. The proposed system and measurement strategy are experimentally evaluated and demonstrated to measure motion of multiple cantilevers in an array. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:3
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共 9 条
[1]   High throughput label-free platform for statistical bio-molecular sensing [J].
Bosco, Filippo G. ;
Hwu, En-Te ;
Chen, Ching-Hsiu ;
Keller, Stephan ;
Bache, Michael ;
Jakobsen, Mogens H. ;
Hwang, Ing-Shouh ;
Boisen, Anja .
LAB ON A CHIP, 2011, 11 (14) :2411-2416
[2]   Cantilever array sensors [J].
Lang, Hans Peter ;
Hegner, Martin ;
Gerber, Christoph .
MATERIALS TODAY, 2005, 8 (04) :30-36
[3]   High throughput optical readout of dense arrays of nanomechanical systems for sensing applications [J].
Martinez, N. F. ;
Kosaka, P. M. ;
Tamayo, J. ;
Ramirez, J. ;
Ahumada, O. ;
Mertens, J. ;
Hien, T. D. ;
Rijn, C. V. ;
Calleja, M. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (12)
[4]   SIMULTANEOUS MEASUREMENT OF LATERAL AND NORMAL FORCES WITH AN OPTICAL-BEAM-DEFLECTION ATOMIC FORCE MICROSCOPE [J].
MEYER, G ;
AMER, NM .
APPLIED PHYSICS LETTERS, 1990, 57 (20) :2089-2091
[5]   Micromechanical cantilever-based biosensors [J].
Raiteri, R ;
Grattarola, M ;
Butt, HJ ;
Skládal, P .
SENSORS AND ACTUATORS B-CHEMICAL, 2001, 79 (2-3) :115-126
[6]   Design and Evaluation of Torsional Probes for Multifrequency Atomic Force Microscopy [J].
Sriramshankar, R. ;
Jayanth, G. R. .
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2015, 20 (04) :1843-1853
[7]   Parallel atomic force microscopy with optical interferometric detection [J].
Sulchek, T ;
Grow, RJ ;
Yaralioglu, GG ;
Minne, SC ;
Quate, CF ;
Manalis, SR ;
Kiraz, A ;
Aydine, A ;
Atalar, A .
APPLIED PHYSICS LETTERS, 2001, 78 (12) :1787-1789
[8]   Biosensors based on nanomechanical systems [J].
Tamayo, Javier ;
Kosaka, Priscila M. ;
Ruz, Jose J. ;
San Paulo, Alvaro ;
Calleja, Montserrat .
CHEMICAL SOCIETY REVIEWS, 2013, 42 (03) :1287-1311
[9]   Imaging the surface stress and vibration modes of a microcantilever by laser beam deflection microscopy [J].
Tamayo, Javier ;
Pini, Valerio ;
Kosaka, Prisicila ;
Martinez, Nicolas F. ;
Ahumada, Oscar ;
Calleja, Montserrat .
NANOTECHNOLOGY, 2012, 23 (31)