X-ray topography of GdCa4O(BO3)3 single crystals grown by the Czochralski method

被引：6
作者：
Wierzbicka, E
Klos, A
Lefeld-Sosnowska, M
Pajaczkowska, A
机构：
[1] Univ Warsaw, Inst Expt Phys, PL-00681 Warsaw, Poland
[2] Inst Elect Mat Technol, PL-01919 Warsaw, Poland
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2006年 / 203卷 / 02期
关键词：
D O I：
10.1002/pssa.200521030
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
GdCa4(BO3)(3) single crystals grown by the Czochralski technique were investigated by conventional transmission and back-reflection X-ray topography. The results were correlated with the growth conditions and stoichiometry of the crystals. Extended defects, especially dislocations, with different density, in samples cut perpendicular and parallel to the b-axis were investigated. Long, straight dislocations lying perpendicular to [100] and [010] directions were observed. Periodical, small fluctuations of the diameter induced some defects.
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页码：220 / 226
页数：7
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