共 60 条
[1]
Verification of compaction and rarefaction models for fused silica with 40 billion pulses of 193-nm excimer laser exposure and their effects on projection lens imaging performance
[J].
OPTICAL MICROLITHOGRAPHY XVII, PTS 1-3,
2004, 5377
:1815-1827
[2]
Induced density changes in 193-nm excimer-laser-damaged silica glass: a kinetic model
[J].
OPTICAL MICROLITHOGRAPHY XVII, PTS 1-3,
2004, 5377
:827-835
[4]
Optimization of nanomachining repair conditions for ArF lithography
[J].
23RD ANNUAL BACUS SYMPOSIUM ON PHOTOMASK TECHNOLOGY, PTS 1 AND 2,
2003, 5256
:538-545
[5]
Phase defect detection with spatial heterodyne interferometry
[J].
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XVIII, PTS 1 AND 2,
2004, 5375
:18-28
[6]
Critical issues in 157 nm lithography
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1998, 16 (06)
:3154-3157
[7]
Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
[J].
JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS,
2004, 3 (01)
:68-72
[9]
Specification of the phase angle of a 6% attenuated PSM mask used in ArF lithography
[J].
OPTICAL MICROLITHOGRAPHY XVII, PTS 1-3,
2004, 5377
:902-910
[10]
Simulation-based critical area extraction and litho-friendly layout design for low k1 lithography
[J].
OPTICAL MICROLITHOGRAPHY XVII, PTS 1-3,
2004, 5377
:713-720