Fatigue and debris generation at indentation-induced cracks in silicon

被引:16
作者
Bhowmick, Sanjit [1 ]
Cha, Hyunmin [2 ]
Jung, Yeon-Gil [2 ]
Lawn, Brian R. [1 ]
机构
[1] Natl Inst Stand & Technol, Div Ceram, Gaithersburg, MD 20899 USA
[2] Changwon Natl Univ, Sch Nano & Adv Mat Engn, Chang Won 641773, Kyung Nam, South Korea
基金
美国国家科学基金会;
关键词
Fatigue; Silicon; Contact damage; Internal friction; SINGLE-CRYSTAL SILICON; HIGH-CYCLE FATIGUE; HERTZIAN FRACTURE; STRESS-CORROSION; STRUCTURAL FILMS; DIAMOND FACES; POLYSILICON; FAILURE; CERAMICS; STRENGTH;
D O I
10.1016/j.actamat.2008.10.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The nature of fatigue in bulk silicon subjected to cyclic loading is considered. Indentation tests with hard spheres of millimeter-scale radius are used to generate fractures principally in {100} silicon Surfaces, but also in selected {111} silicon, polycrystalline silicon and {100} monocrystalline germanium surfaces. Pronounced damage accumulation is observed with progressive indenter cycling, as ejector of slabs and particles onto the specimen Surfaces. It is argued that the fatigue arises from sliding at friction points within the crack interfaces, with consequent production of debris outside and (ultimately) within the contact. Section views through the indentation sites provide clues as to the material ejection process, involving coalescence of secondary cracks into a primary ring crack to create the slabs. Ejection is facilitated by linkage between adjacent ring cracks, leading ultimately to mass removal. Published by Elsevier Ltd oil behalf of Acta Materialia Inc.
引用
收藏
页码:582 / 589
页数:8
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