A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET

被引:45
作者
Roy, AS [1 ]
Sallese, JM [1 ]
Enz, CC [1 ]
机构
[1] Swiss Fed Inst Technol, EPFL, CH-1015 Lausanne, Switzerland
关键词
D O I
10.1016/j.sse.2006.03.021
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Although both exact [Taur Y, Liang X, Wang W, Lu H. A continuous, analytic drain-current model for DG MOSFETs. IEEE Electron Dev Lett 2004;25(2):399-401] and design oriented approximate [Sallese JM, Krummenacher F, Prgaldiny F, Lallement C, Roy A, Enz C. A design oriented charge-based current model for symmetric DG MOSFET and its correlation with the EKV formalism. Solid-State Electron 2005;49(3):485-9] closed-form analytical solution of the drain current for the symmetric double gate (DG) MOST exist, a closed-form expression for asymmetric DG MOST is still lacking. In this context, this work presents a semi-empirical analytic closed-form charge-based expression for the drain current of asymmetric DG MOST that is valid from weak to strong inversion and retains the asymptotic behavior. In addition, important small-signal quantities such as the transconductance-to-current ratio are readily obtained and reveal that these are nearly insensitive to the degree of asymmetry. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:687 / 693
页数:7
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