Method of determination of the energy band gap of oxide films

被引：3

作者：

Shapovalov, V. I. ^{[1
]}

Komlev, A. E. ^{[1
]}

Komlev, A. A. ^{[1
]}

Morozova, A. A. ^{[1
]}

Lapshin, A. E. ^{[2
]}

机构：

[1] VI Ulyanov Lenin St Petersburg State Electrotech, St Petersburg 197376, Russia

[2] Russian Acad Sci, Grebenshchikov Inst Silicate Chem, St Petersburg 199034, Russia

来源：

GLASS PHYSICS AND CHEMISTRY | 2013年 / 39卷 / 06期

基金：

俄罗斯基础研究基金会;

关键词：

film; oxide; transmission spectrum; energy band gap; tungsten oxide film;

D O I：

10.1134/S1087659613060096

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In the present work, the method of determining the energy band gap of oxide films is suggested based on the experimental transmission spectra in the fundamental absorption range. The use of the method is illustrated, taking as an example the investigation of the effect of technological deposition regimes on the physical properties of tungsten oxide films.

引用

页码：664 / 666

页数：3

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