Effect of annealing temperature on the electrostrictive properties of 0.94(Na0.5Bi0.5)TiO3-0.06BaTiO3 thin films

被引:8
作者
Liu, X. [2 ]
Zheng, X. J. [1 ,2 ]
Liu, J. Y. [2 ]
Zhou, K. S. [3 ]
Huang, D. H. [3 ]
机构
[1] Univ Shanghai Sci & Technol, Sch Mat Sci & Engn, Shanghai 200093, Peoples R China
[2] Xiangtan Univ, Fac Mat Optoelect & Phys, Xiangtan 411105, Hunan, Peoples R China
[3] Cent S Univ, Sch Phys Sci & Technol, Changsha 410083, Hunan, Peoples R China
关键词
0.94(Na0.5Bi0.5)TiO3-0.06BaTiO(3); Thin films; Piezoelectricity; Ferroelectricity; Electrostrictive properties; CHEMICAL SOLUTION DEPOSITION; METAL-ORGANIC DECOMPOSITION; ELECTRICAL-PROPERTIES; CERAMICS; INSTABILITY; DIELECTRICS; ORIENTATION; STRAIN;
D O I
10.1007/s10832-012-9771-y
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
0.94(Na0.5Bi0.5)TiO3-0.06BaTiO(3) (NBT-BT6) thin films were fabricated by metal-organic decomposition (MOD) at the different annealing temperatures. Based on the electrostrictive effect and converse piezoelectric effect, the phenomenological approach is provided to characterize the electrostrictive properties of the perovskite relaxor, and it is used to determine the effective electrostriction coefficients and electrostrictive strains of NBT-BT6 thin films annealed at the range of 650-800 A degrees C. After the microstructure, ferroelectric, dielectric and piezoelectric properties of the thin films were determined, the maximum values of and of NBT-BT6 thin film annealed at 750 A degrees C are respectively determined as 0.0289 m(4)/C-2 and 0.26 % under the bipolar driving field of 391 kV/cm. They are strongly influenced by annealing temperature due to the bismuth evaporation and crystallization of perovskite phase, and the enhanced electrostrictive properties could make NBT-based thin film a promising candidate to the design and application of stacked actuators, microangle-adjusting devices, and oil pressure servo valves.
引用
收藏
页码:270 / 276
页数:7
相关论文
共 23 条
[1]   High, purely electrostrictive strain in lead-free dielectrics [J].
Ang, C ;
Yu, Z .
ADVANCED MATERIALS, 2006, 18 (01) :103-106
[2]   Preparation and characterization of sol-gel derived (100)-textured Pb(Zr,Ti)O3 thin films:: PbO seeding role in the formation of preferential orientation [J].
Gong, W ;
Li, JF ;
Chu, XC ;
Gui, ZL ;
Li, LT .
ACTA MATERIALIA, 2004, 52 (09) :2787-2793
[3]   Composition-induced antiferroelectric phase and giant strain in lead-free (Nay,Biz)Ti1-xO3(1-x)-xBaTiO3 ceramics [J].
Guo, Yiping ;
Gu, Mingyuan ;
Luo, Haosu ;
Liu, Yun ;
Withers, Ray L. .
PHYSICAL REVIEW B, 2011, 83 (05)
[4]   Structure and electrical properties of trilayered BaTiO3/(Na0.5Bi0.5)TiO3-BaTiO3/BaTiO3 thin films deposited on Si substrate [J].
Guo, Yiping ;
Akai, Daisuke ;
Sawada, Kzauaki ;
Ishida, Makoto ;
Gu, Mingyuan .
SOLID STATE COMMUNICATIONS, 2009, 149 (1-2) :14-17
[5]   Effects of annealing schedule on orientation of Bi3.2Nd0.8Ti3O12 ferroelectric film prepared by chemical solution deposition process [J].
He, H. Y. ;
Huang, J. F. ;
Cao, L. Y. ;
Wang, L. S. .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2006, 133 (1-3) :132-135
[6]   Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces [J].
Kalinin, SV ;
Bonnell, DA .
PHYSICAL REVIEW B, 2002, 65 (12) :1-11
[7]   Interferometric measurements of electric field-induced displacements in piezoelectric thin films [J].
Kholkin, AL ;
Wutchrich, C ;
Taylor, DV ;
Setter, N .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (05) :1935-1941
[8]   Characterization of the effective electrostriction coefficients in ferroelectric thin films [J].
Kholkin, AL ;
Akdogan, EK ;
Safari, A ;
Chauvy, PF ;
Setter, N .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (12) :8066-8073
[9]   Influence of the morphology of ferroelectric SrBi2Ta2O9 thin films deposited by metal organic decomposition on its electrical characteristics [J].
Moert, M ;
Schindler, G ;
Mikolajick, T ;
Nagel, N ;
Hartner, W ;
Dehm, C ;
Kohlstedt, H ;
Waser, R .
APPLIED SURFACE SCIENCE, 2005, 249 (1-4) :23-30
[10]   Electrostriction: Nonlinear electromechanical coupling in solid dielectrics [J].
Newnham, RE ;
Sundar, V ;
Yimnirun, R ;
Su, J ;
Zhang, QM .
JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (48) :10141-10150