Extraction of a nonlinear AC FET model using small-signal S-parameters

被引：17

作者：

Vuolevi, JHK ^{[1
]}

Rahkonen, T ^{[1
]}

机构：

[1] Univ Oulu, Dept Elect Engn, Elect Lab, FIN-90014 Oulu, Finland

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2002年 / 50卷 / 05期

关键词：

nonlinear characterization; nonlinearity; pulsed S-parameter measurements; S-parameters; self-heating; third-order intermodulation; Volterra model;

D O I：

10.1109/22.999144

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The nonlinearities of an RF FET can be obtained by a set of small-signal circuit elements extracted over a range of terminal voltages and temperatures. This study used pulsed S-parameter measurements on a 3 x 3 dc-bias-point grid at two different temperatures to obtain electrical and electrothermal nonlinearity coefficients up to the third order. The extracted nonlinear ac model can be used in Volterra analysis to gain an insight into distortion mechanisms. The measurement results were in good agreement with the calculated third-order intermodulation values.

引用

页码：1311 / 1315

页数：5

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