Demonstration of up-conversion fluorescence from Ar clusters in intense free-electron-laser fields

被引：14

作者：

Iwayama, Hiroshi ^{[1
,2
,3
]}

Nagasono, Mitsuru ^{[3
]}

Harries, James R. ^{[3
,4
]}

Shigemasa, Eiji ^{[1
,2
,3
]}

机构：

[1] IMS, UVSOR, Okazaki, Aichi 4448585, Japan

[2] SOKENDAI, Okazaki, Aichi 4448585, Japan

[3] RIKEN SPring 8, Sayo, Hyogo 6795148, Japan

[4] JAEA SPring 8, Sayo, Hyogo 6795148, Japan

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 21期

关键词：

PHYSICS;

D O I：

10.1364/OE.20.023174

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Extreme ultraviolet (EUV) fluorescence emitted from Ar clusters irradiated by intense EUV free electron laser (FEL) pulses has been investigated. The EUV fluorescence spectra display rich structure at wavelengths shorter than the incident FEL wavelength of 51 nm. The results suggest that multiply-charged ions are produced following the ion-electron recombination processes which occur in the nanoplasma created by multi-photon excitation during the intense EUV-FEL pulses. (C)2012 Optical Society of America

引用

页码：23174 / 23179

页数：6

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