Phase Structure, Raman Spectra, Microstructure, and Dielectric Properties of (K0.5 Na0.5)NbO3-Bi(Li1/3Zr2/3)O3 Solid Solutions

被引:20
作者
Zhang, Hailin [1 ]
Li, Xu [1 ]
Chen, Xiuli [1 ]
Zhou, Huanfu [1 ]
Li, Xiaoxia [1 ]
Yan, Xiao [1 ]
Liu, Gaofeng [1 ]
Sun, Jie [1 ]
机构
[1] Guilin Univ Technol, Key Lab Nonferrous Mat & New Proc Technol, Guangxi Key Lab Opt & Elect Mat & Devices, Minist Educ,Sch Mat Sci & Engn, Guilin 541004, Peoples R China
关键词
Raman spectroscopy; dielectric properties; thermal stability; GOOD THERMAL-STABILITY; PIEZOELECTRIC PROPERTIES; CERAMICS; FUTURE;
D O I
10.1007/s11664-019-07168-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, (1-x)(K0.5Na0.5)NbO3-xBi(Li1/3Zr2/3)O-3 (KNN-BLZ, x=0, 0.005, 0.01, 0.015, or 0.02) lead-free ceramics were fabricated. The effects of the addition of Bi(Li1/3Zr2/3)O-3 on the dielectric properties, microstructure, and phase structure of the KNN ceramics were studied. The structures of KNN ceramics shifted from an orthorhombic to tetragonal phase structure with the addition of Bi(Li1/3Zr2/3)O-3. Furthermore, at x=0.005, the ceramics exhibited good thermal stability (epsilon/epsilon(150 degrees C)+/- 10%), low dielectric loss (tan<2.5%), and large relative permittivity (epsilon 2160) in the temperature range of 154-370 degrees C. Additionally, the electrical properties of the ceramic at high temperatures showed that the basic mechanism of the conduction and relaxation processes was thermal activation, and oxygen vacancies may be one of the mobile charge carriers.
引用
收藏
页码:4017 / 4024
页数:8
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