Structure of the SiC (0001) 3 X 3 reconstruction studied by surface X-ray diffraction

被引：5
|
作者：
Voegeli, W.
Akimoto, K.
Aoyama, T.
Sumitani, K.
Nakatani, S.
Tajiri, H.
Takahashi, T.
Hisada, Y.
Mukainakano, S.
Zhang, X.
Sugiyama, H.
Kawata, H.
机构：
[1] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan
[3] DENSO CORP, Aichi 4700111, Japan
[4] High Energy Accelerator Res Org, Photon Factory, Tsukuba, Ibaraki 3050801, Japan
来源：
APPLIED SURFACE SCIENCE | 2006年 / 252卷 / 15期
关键词：
silicon carbide; SiC; surface structure; reconstruction; X-ray diffraction;
D O I：
10.1016/j.apsusc.2005.12.019
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The surface structure of the 3 x 3 reconstruction of the 4H-SiC (0001) surface was investigated with surface X-ray diffraction (SXRD). Of the studied models, the twist model proposed by Starke et al. [U. Starke, J. Schardt, J. Bernhardt, M. Franke, K. Reuter, H. Wedler, K. Heinz, J. Furthmuller, P. Kackell, F. Bechstedt, Phys. Rev. Lett. 80 (1998) 758] gave the best fit to the experimental data. The structural parameters were determined accurately. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：5259 / 5262
页数：4
相关论文
共 50 条
  • [1] Structural study of SiC(0001)3 x 3 surface by surface X-ray diffraction
    Aoyama, T
    Akimoto, K
    Ichimiya, A
    Hisada, Y
    Mukainakano, S
    Emoto, T
    Tajiri, H
    Takahashi, T
    Sugiyama, H
    Zhang, X
    Kawata, H
    APPLIED SURFACE SCIENCE, 2003, 216 (1-4) : 356 - 360
  • [2] Cubic SiC surface structure studied by X-ray diffraction
    D'Angelo, M
    Enriquez, H
    Aristov, VY
    Soukiassian, P
    Renaud, G
    Barbier, A
    Chiang, S
    Semond, F
    Di Cioccio, L
    Billion, T
    SILICON CARBIDE AND RELATED MATERIALS - 2002, 2002, 433-4 : 571 - 574
  • [3] Structure of Si(001)-(4x3)-In surface studied by X-ray photoelectron diffraction
    Shimomura, M
    Nakamura, T
    Kim, KS
    Abukawa, T
    Tani, J
    Kono, S
    SURFACE REVIEW AND LETTERS, 1999, 6 (06) : 1097 - 1102
  • [4] Energetics of the α-SiC(0001)-(3x3) surface reconstruction
    Badziag, P
    SURFACE SCIENCE, 1998, 402 (1-3) : 822 - 826
  • [5] Structure of the Si(113) surface studied by surface X-ray diffraction
    Mizuno, Y
    Akimoto, K
    Aoyama, T
    Suzuki, H
    Nakahara, H
    Ichimiya, A
    Sumitani, K
    Takahashi, T
    Zhang, XW
    Sugiyama, H
    Kawata, H
    APPLIED SURFACE SCIENCE, 2004, 237 (1-4) : 40 - 44
  • [6] Multilayer relaxation of Ru(0001)-(2 x 2)-O studied by surface X-ray diffraction
    Nakamura, Masashi
    Kato, Hayato
    Hoshi, Nagahiro
    Sumitani, Kazushi
    Sakata, Osami
    JOURNAL OF PHYSICAL CHEMISTRY C, 2007, 111 (02): : 977 - 980
  • [7] Reconstructions 3 x 3 and √3 x √3 on SiC(0001) studied using RHEED
    Yakovlev, Nikolai
    Xianning, Xie
    Ping, Loh Kian
    Hai, Xu
    SURFACE SCIENCE, 2009, 603 (15) : 2263 - 2270
  • [8] The SiC(0001) √3 x √3 surface state
    Glans, PA
    Johansson, LI
    SURFACE SCIENCE, 2000, 465 (1-2) : L759 - L763
  • [9] Structure of vitreous KPO3 studied by neutron and X-ray diffraction
    Hoppe, U
    Walter, G
    Stachel, D
    Hannon, AC
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1996, 100 (09): : 1569 - 1573
  • [10] (√3 x √3) R30° reconstruction of the 6H-SiC (0001) surface:: A simple T4 Si adatom structure solved by grazing-incidence x-ray diffraction
    Coati, A
    Sauvage-Simkin, M
    Garreau, Y
    Pinchaux, R
    Argunova, T
    Aïd, K
    PHYSICAL REVIEW B, 1999, 59 (19) : 12224 - 12227
12345