CMOS Charge Pump With Transfer Blocking Technique for No Reversion Loss and Relaxed Clock Timing Restriction

被引:33
作者
Kim, Joung-Yeal [1 ,2 ]
Jun, Young-Hyun [2 ]
Kong, Bai-Sun [1 ]
机构
[1] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
[2] Samsung Elect, Memory Div, Hwasung 445701, South Korea
关键词
Blocking technique; charge pump; voltage doubler; voltage generator;
D O I
10.1109/TCSII.2008.2008521
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A CMOS charge pump based on a transfer blocking technique and a modified precharge scheme is proposed for avoiding reversion loss and relaxing the timing restrictions imposed on input clocks. Comparison results in an 80-nm CMOS process indicate that, with no loading current, the output voltage of the proposed charge pump reaches almost 98% of the ideal boosting level with switching ripple reduced by up to 97%. They also indicate that output voltage deviations due to temperature and process variations are reduced by 24%-98% and 81%-95%, respectively.
引用
收藏
页码:11 / 15
页数:5
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