Crystallization kinetics of an amorphous TiAl sheet produced by PVD

被引：26

作者：

Senkov, ON

Uchic, MD

Menon, S

Miracle, DB

机构：

[1] Universal Energy Syst Inc, Dayton, OH 45432 USA

[2] USAF, Res Lab, Mat & Mfg Directorate, MLLMD, Wright Patterson AFB, OH 45433 USA

来源：

SCRIPTA MATERIALIA | 2002年 / 46卷 / 03期

关键词：

physical vapor deposition; differential thermal analysis; X-ray diffraction; amorphous materials; titanium aluminide; phase transformations;

D O I：

10.1016/S1359-6462(01)01218-0

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

An amorphous, 150 mum thick freestanding sheet of a TiAl-based alloy was produced by a physical vapor deposition method. The following phase transformations were observed and analyzed using differential thermal analysis and X-ray diffraction, amorphous --> body centered cubic beta --> hexagonal close-packed alpha --> tetragonal gamma + ordered HCP alpha(2). (C) 2002 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

引用

页码：187 / 192

页数：6

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