Non-contact and on-line cone diameter measuring based on high speed linear CCD

被引:0
作者
Zhou, GH [1 ]
Wang, JH
机构
[1] Changchun Inst Opt Fine Mech & Phys, Changchun 130023, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
[3] HarBin Normal Univ, Harbin 150080, Peoples R China
来源
2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2 | 2006年 / 6150卷
关键词
linear CCD; cone detecting; non-contact detecting; on-line detecting; boundary recognition;
D O I
10.1117/12.678611
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The remarkable improvement of sensing and processing hardware performance makes the non-contact, on-line, high accuracy and high speed measuring possible by means of linear CCD. The goal of this pager is to describe the key questions on designing the cone diameter detecting system by linear CCD. This paper first describes the detecting scheme. In particular, the factors affecting accuracy, such as resolution, voltage difference between neighbor pixels, detecting rate and so on, are analyzed, and the quantitative estimation equations are provided. CCD takes on the photoelectric translation and measuring component double functions, so the waveform of CCD output signal and the affecting factors merit deep discussion. On the basis of discussion, several principles that can be used to improve the boundary recognition accuracy are presented.
引用
收藏
页数:6
相关论文
共 3 条
[1]  
[雷志勇 Lei Zhiyong], 2002, [光学技术, Optical technology], V28, P475
[2]  
*TEX INSTR, TMS320VC5402 FIX POI
[3]  
WANG QY, 2000, CCD APPL TECHNOLOGY, P103