Trimming of step-edge junctions for improvement of SQUID performance

被引：21

作者：

Du, J ^{[1
]}

Lam, SKH ^{[1
]}

Tilbrook, DL ^{[1
]}

Foley, CP ^{[1
]}

机构：

[1] CSIRO Telecommun & Ind Phys, Lindfield, NSW 2070, Australia

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2002年 / 15卷 / 01期

关键词：

D O I：

10.1088/0953-2048/15/1/330

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have applied an Ar ion beam etching technique to trim the critical current, I-c, and the normal resistance, R-n, of step-edge Josephson junctions which provides a means to optimize SQUID performance. By using this technique, I-c can be reduced by more than one order of magnitude and R-n can be increased to over 10 Omega. Significant improvements in SQUID performance have been demonstrated with this technique. White noise of 80 f T Hz(-1/2) was achieved from a trimmed 5 mm dc SQUID that had poor initial performance.

引用

页码：165 / 169

页数：5

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