Entropic One-Class Classifiers

被引:15
|
作者
Livi, Lorenzo [1 ]
Sadeghian, Alireza [1 ]
Pedrycz, Witold [2 ,3 ,4 ]
机构
[1] Ryerson Univ, Dept Comp Sci, Toronto, ON M5B 2K3, Canada
[2] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6R 2V4, Canada
[3] King Abdulaziz Univ, Fac Engn, Dept Elect & Comp Engn, Jeddah 21589, Saudi Arabia
[4] Polish Acad Sci, Syst Res Inst, PL-01447 Warsaw, Poland
关键词
Dissimilarity representation; entropic spanning graph; fuzzy set; modularity measure; one-class classification; ONE-CLASS CLASSIFICATION; THEORETIC APPROACH; INFORMATION; MODULARITY; SELECTION;
D O I
10.1109/TNNLS.2015.2418332
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The one-class classification problem is a well-known research endeavor in pattern recognition. The problem is also known under different names, such as outlier and novelty/anomaly detection. The core of the problem consists in modeling and recognizing patterns belonging only to a so-called target class. All other patterns are termed nontarget, and therefore, they should be recognized as such. In this paper, we propose a novel one-class classification system that is based on an interplay of different techniques. Primarily, we follow a dissimilarity representation-based approach; we embed the input data into the dissimilarity space (DS) by means of an appropriate parametric dissimilarity measure. This step allows us to process virtually any type of data. The dissimilarity vectors are then represented by weighted Euclidean graphs, which we use to determine the entropy of the data distribution in the DS and at the same time to derive effective decision regions that are modeled as clusters of vertices. Since the dissimilarity measure for the input data is parametric, we optimize its parameters by means of a global optimization scheme, which considers both mesoscopic and structural characteristics of the data represented through the graphs. The proposed one-class classifier is designed to provide both hard (Boolean) and soft decisions about the recognition of test patterns, allowing an accurate description of the classification process. We evaluate the performance of the system on different benchmarking data sets, containing either feature-based or structured patterns. Experimental results demonstrate the effectiveness of the proposed technique.
引用
收藏
页码:3187 / 3200
页数:14
相关论文
共 50 条
  • [1] One-Class Classifiers Based on Entropic Spanning Graphs
    Livi, Lorenzo
    Alippi, Cesare
    IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, 2017, 28 (12) : 2846 - 2858
  • [2] One-class classifiers
    Brereton, Richard G.
    JOURNAL OF CHEMOMETRICS, 2011, 25 (05) : 225 - 246
  • [3] Active Learning for One-Class Classification Using Two One-Class Classifiers
    Schlachter, Patrick
    Yang, Bin
    2018 26TH EUROPEAN SIGNAL PROCESSING CONFERENCE (EUSIPCO), 2018, : 1197 - 1201
  • [4] Combining Diverse One-Class Classifiers
    Krawczyk, Bartosz
    Wozniak, Michal
    HYBRID ARTIFICIAL INTELLIGENT SYSTEMS, PT II, 2012, 7209 : 590 - 601
  • [5] Overview of study on one-class classifiers
    Pan, Zhi-Song
    Chen, Bin
    Miao, Zhi-Min
    Ni, Gui-Qiang
    Tien Tzu Hsueh Pao/Acta Electronica Sinica, 2009, 37 (11): : 2496 - 2503
  • [6] One-class remote sensing classification: one-class vs. binary classifiers
    Deng, Xueqing
    Li, Wenkai
    Liu, Xiaoping
    Guo, Qinghua
    Newsam, Shawn
    INTERNATIONAL JOURNAL OF REMOTE SENSING, 2018, 39 (06) : 1890 - 1910
  • [7] An Approach for Raising the Accuracy of One-class Classifiers
    Wang, Chi-Kai
    Ting, Yung
    Liu, Yi-Hung
    11TH INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION, ROBOTICS AND VISION (ICARCV 2010), 2010, : 872 - 877
  • [8] One-class support vector classifiers: A survey
    Alam, Shamshe
    Sonbhadra, Sanjay Kumar
    Agarwal, Sonali
    Nagabhushan, P.
    Knowledge-Based Systems, 2021, 196
  • [9] One-class support vector classifiers: A survey
    Alam, Shamshe
    Sonbhadra, Sanjay Kumar
    Agarwal, Sonali
    Nagabhushan, P.
    KNOWLEDGE-BASED SYSTEMS, 2020, 196
  • [10] Using binary classifiers for one-class classification
    Kang, Seokho
    EXPERT SYSTEMS WITH APPLICATIONS, 2022, 187