Spectroscopic Ellipsometry Studies of Ferroelectric SbSexS1xI Crystals

被引：1

作者：

Audzijonis, A. ^{[1
]}

Reza, A. ^{[1
]}

Zaltauskas, R. ^{[1
]}

Zigas, L. ^{[1
]}

Sereika, R. ^{[1
]}

Paskevic, C. ^{[2
]}

Pauliukas, A. ^{[1
]}

机构：

[1] Vilnius Pedag Univ, Dept Phys, LT-08106 Vilnius, Lithuania

[2] Vilnius State Univ, Inst Theoret Phys & Astron, LT-01108 Vilnius, Lithuania

来源：

FERROELECTRICS | 2008年 / 366卷

关键词：

Spectroscopic ellipsometry; dielectric constants; SbSeI; SbSI;

D O I：

10.1080/00150190802363124

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the present paper the optical spectra were measured by spectroscopic ellipsometry method in the range of 0.5-5.0 eV making use of a computer-controlled photometric ellipsometer with a rotating analyzer. The measurement data were traded in terms of a pseudodielectric function (PDF) in framework of the two-phase isotropic ambient-anisotropic homogeneous sample approximation. Anisotropic properties of the sample were revealed by performing the measurement with the sample at two orthogonal orientations with respect to the plane incidence. Two components of the dielectric tensor for crystal of orthorhombic symmetry were determined. The experimental spectra of the dielectric tensor components were approximated by the contributions of Laurence oscillators in order to determine the main optical transitions to the optical response.

引用

页码：45 / 54

页数：10

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