Transport in split gate MOS quantum dot structures

被引:2
作者
Gunther, AD [1 ]
Goodnick, SM [1 ]
Khoury, M [1 ]
Krishnasamy, AE [1 ]
Rack, MJ [1 ]
Thornton, TJ [1 ]
机构
[1] Arizona State Univ, Ctr Solid State Elect Res, Tempe, AZ 85287 USA
关键词
D O I
10.1016/S0167-9317(99)00167-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have fabricated symmetric 200 nm and asymmetric 100 by 200 nm quantum dots by the split gate technique within a MOSFET structure. DC electrical and magnetotransport measurements were performed at 4.2 K in a liquid-Helium cryostat. It is found that varying the electrochemical potential by changing the bias on a top gate leads to oscillations in the DC conductance through the dot resembling Coulomb blockade peaks, but when the depletion gate biases are swept, these peaks become more complex in nature, exhibiting crossing or anti-crossing behavior.
引用
收藏
页码:123 / 125
页数:3
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