Interface Schottky barrier in Hf2NT2/MSSe (T = F, O, OH; M = Mo, W) heterostructures

被引:22
作者
Jing, Tao [1 ]
Liang, Dongmei [1 ]
Hao, Jinxin [2 ]
Deng, Mingsen [2 ]
Cai, Shaohong [3 ]
机构
[1] Kaili Univ, Coll Sci, Kaili 556011, Peoples R China
[2] Guizhou Educ Univ, Appl Phys Inst, Guizhou Prov Key Lab Computat Nanomat Sci, Guiyang 550018, Guizhou, Peoples R China
[3] Guizhou Univ Finance & Econ, Guizhou Key Lab Econ Syst Simulat, Guiyang 550004, Guizhou, Peoples R China
基金
美国国家科学基金会;
关键词
MXENE MONOLAYERS; JANUS MOSSE; MOBILITY; CARBIDES;
D O I
10.1039/c9cp00028c
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The Schottky barrier height (SBH) is a critical parameter that determines the carrier transfer at metal/semiconductor interfaces. In this work, the interfacial properties of Hf2NT2/MSSe (T = F, O, OH; M = Mo, W) heterostructures are systematically investigated using first-principles calculations. It is found that, for MoSSe and WSSe, the use of S or Se atomic layers in contact with Hf2NT2 can give significantly different SBHs. In addition, SB-free contact for electron injection can be realized for F-S interfaces in Hf2NF2/MoSSe and Hf2NF2/WSSe heterostructures. Furthermore, the SBHs of the heterostructures can be tuned by applying compressive strain and p-type ohmic contact can be obtained for O-Se interfaces in Hf2NO2/MoSSe and Hf2NO2/WSSe heterostructures. This work proposes a feasible strategy to regulate the SBHs of interfaces.
引用
收藏
页码:5394 / 5401
页数:8
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