An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers

被引：10

作者：

Hilbert, Vinzenz ^{[1
]}

Blinne, Alexander ^{[2
]}

Fuchs, Silvio ^{[1
]}

Feigl, Torsten ^{[3
]}

Kaempfer, Tino ^{[1
,4
]}

Roedel, Christian ^{[1
,4
]}

Uschmann, Ingo ^{[1
,4
]}

Wuensche, Martin ^{[1
,4
]}

Paulus, Gerhard G. ^{[1
]}

Foerster, Eckhart ^{[1
,4
]}

Zastrau, Ulf ^{[1
]}

机构：

[1] Univ Jena, Inst Opt & Quantum Elect, D-07743 Jena, Germany

[2] Univ Jena, Inst Theoret Phys, D-07743 Jena, Germany

[3] Fraunhofer Inst Appl Opt & Precis Engn, D-07745 Jena, Germany

[4] Helmholtz Inst, D-07743 Jena, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2013年 / 84卷 / 09期

关键词：

X-RAY LASER; LONGITUDINAL COHERENCE MEASUREMENTS; PLASMA DIAGNOSTICS; BEAM; OPTICS;

D O I：

10.1063/1.4821146

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a Michelson interferometer for 13.5 nm soft x-ray radiation. It is characterized in a proof-of-principle experiment using synchrotron radiation, where the temporal coherence is measured to be 13 fs. The curvature of the thin-film beam splitter membrane is derived from the observed fringe pattern. The applicability of this Michelson interferometer at intense free-electron lasers is investigated, particularly with respect to radiation damage. This study highlights the potential role of such Michelson interferometers in solid density plasma investigations using, for instance, extreme soft x-ray free-electron lasers. A setup using the Michelson interferometer for pseudo-Nomarski-interferometry is proposed. (C) 2013 AIP Publishing LLC.

引用

页数：6

共 33 条

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