Testability Modeling and Test Point Optimization Method of Multi-State System

被引:2
作者
Wang, Peng [1 ]
Yu, Yongli [1 ]
Li, Xingxin [1 ]
机构
[1] Army Engn Univ PLA, Shijiazhuang Campus, Shijiazhuang 050003, Peoples R China
来源
IEEE ACCESS | 2020年 / 8卷 / 08期
关键词
Analytical models; Solid modeling; Fault detection; Optimization; Correlation; Indexes; Reliability; Multi-state system; testability modeling; state detection; test point optimization; fault diagnosis and isolation; FAULT-DIAGNOSIS; RELIABILITY;
D O I
10.1109/ACCESS.2020.3018693
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Existing testability models are difficult to describe the multi-state characteristics of the system, so it is necessary to study the testability modeling method applicable to multi-state systems. A testability model with structure and function as the object is established in this paper. In order to describe the relationship between system state and test, the calculation method of the detectable state set of the test set is introduced. In order to quantitatively describe the testability of the system state, the concept of state detection rate is proposed for the first time. A test point optimization method that comprehensively considers the system fault detection rate, fault isolation rate, and state detection rate under the constraints of test cost is proposed. A numerical example shows that the best test set obtained by this method cannot only complete the system fault detection and isolation, but also obtain more system state.
引用
收藏
页码:155011 / 155019
页数:9
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